000 | 03878nam a22005895i 4500 | ||
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001 | 978-981-10-6280-3 | ||
003 | DE-He213 | ||
005 | 20210201191509.0 | ||
007 | cr nn 008mamaa | ||
008 | 171004s2018 si | s |||| 0|eng d | ||
020 |
_a9789811062803 _9978-981-10-6280-3 |
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050 | 4 | _aTK7876-7876.42 | |
072 | 7 |
_aTJFN _2bicssc |
|
072 | 7 |
_aTEC024000 _2bisacsh |
|
072 | 7 |
_aTJFN _2thema |
|
082 | 0 | 4 |
_a621.3 _223 |
100 | 1 |
_aDubey, Satya Kesh. _eauthor. _4aut _4http://id.loc.gov/vocabulary/relators/aut |
|
245 | 1 | 0 |
_aLabVIEW based Automation Guide for Microwave Measurements _h[electronic resource] / _cby Satya Kesh Dubey, Naina Narang, P. S. Negi, V. N. Ojha. |
250 | _a1st ed. 2018. | ||
264 | 1 |
_aSingapore : _bSpringer Singapore : _bImprint: Springer, _c2018. |
|
300 |
_aXIV, 45 p. 31 illus. in color. _bonline resource. |
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336 |
_atext _btxt _2rdacontent |
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337 |
_acomputer _bc _2rdamedia |
||
338 |
_aonline resource _bcr _2rdacarrier |
||
347 |
_atext file _bPDF _2rda |
||
490 | 1 |
_aSpringerBriefs in Computational Electromagnetics, _x2365-6239 |
|
500 | _aAcceso multiusuario | ||
520 | _aThe book is focused on measurement automation, specifically using the LabView tool. It explains basic measurements in a simplified manner with appropriate step-by-step explanations and discussions of instrument capabilities. It touches upon aspects of measurement science, microwave measurements and software development for measurement. The book can be used as a guide by technicians, researchers and scientists involved in metrology laboratories to automate measurements. The book explains the development process for automation of measurement systems for every step of the software development lifecycle. It covers system design and automation policy creation. The book uses a top-down approach which enables the reader to relate their own problems and develop a system with their own analysis. The book includes many examples, illustrations, flowcharts, measurement results and screenshots of a worked-out automation software for microwave measurement. The book includes discussions on microwave measurements-attenuation, microwave power and E-field strength. The contents of this book will be of interest to students, researchers and scientists working in the field of electromagnetism, antennas, communication and electromagnetic interference/electromagnetic compatibility (EMI/EMC). . | ||
541 |
_fUABC ; _cTemporal ; _d01/01/2021-12/31/2023. |
||
650 | 0 | _aMicrowaves. | |
650 | 0 | _aOptical engineering. | |
650 | 0 | _aPhysics. | |
650 | 0 | _aElectrical engineering. | |
650 | 1 | 4 |
_aMicrowaves, RF and Optical Engineering. _0https://scigraph.springernature.com/ontologies/product-market-codes/T24019 |
650 | 2 | 4 |
_aNumerical and Computational Physics, Simulation. _0https://scigraph.springernature.com/ontologies/product-market-codes/P19021 |
650 | 2 | 4 |
_aCommunications Engineering, Networks. _0https://scigraph.springernature.com/ontologies/product-market-codes/T24035 |
700 | 1 |
_aNarang, Naina. _eauthor. _4aut _4http://id.loc.gov/vocabulary/relators/aut |
|
700 | 1 |
_aNegi, P. S. _eauthor. _4aut _4http://id.loc.gov/vocabulary/relators/aut |
|
700 | 1 |
_aOjha, V. N. _eauthor. _4aut _4http://id.loc.gov/vocabulary/relators/aut |
|
710 | 2 | _aSpringerLink (Online service) | |
773 | 0 | _tSpringer Nature eBook | |
776 | 0 | 8 |
_iPrinted edition: _z9789811062797 |
776 | 0 | 8 |
_iPrinted edition: _z9789811062810 |
830 | 0 |
_aSpringerBriefs in Computational Electromagnetics, _x2365-6239 |
|
856 | 4 | 0 |
_zLibro electrónico _uhttp://148.231.10.114:2048/login?url=https://doi.org/10.1007/978-981-10-6280-3 |
912 | _aZDB-2-ENG | ||
912 | _aZDB-2-SXE | ||
942 | _cLIBRO_ELEC | ||
999 |
_c244147 _d244146 |