000 03878nam a22005895i 4500
001 978-981-10-6280-3
003 DE-He213
005 20210201191509.0
007 cr nn 008mamaa
008 171004s2018 si | s |||| 0|eng d
020 _a9789811062803
_9978-981-10-6280-3
050 4 _aTK7876-7876.42
072 7 _aTJFN
_2bicssc
072 7 _aTEC024000
_2bisacsh
072 7 _aTJFN
_2thema
082 0 4 _a621.3
_223
100 1 _aDubey, Satya Kesh.
_eauthor.
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
245 1 0 _aLabVIEW based Automation Guide for Microwave Measurements
_h[electronic resource] /
_cby Satya Kesh Dubey, Naina Narang, P. S. Negi, V. N. Ojha.
250 _a1st ed. 2018.
264 1 _aSingapore :
_bSpringer Singapore :
_bImprint: Springer,
_c2018.
300 _aXIV, 45 p. 31 illus. in color.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
490 1 _aSpringerBriefs in Computational Electromagnetics,
_x2365-6239
500 _aAcceso multiusuario
520 _aThe book is focused on measurement automation, specifically using the LabView tool. It explains basic measurements in a simplified manner with appropriate step-by-step explanations and discussions of instrument capabilities. It touches upon aspects of measurement science, microwave measurements and software development for measurement. The book can be used as a guide by technicians, researchers and scientists involved in metrology laboratories to automate measurements. The book explains the development process for automation of measurement systems for every step of the software development lifecycle. It covers system design and automation policy creation. The book uses a top-down approach which enables the reader to relate their own problems and develop a system with their own analysis. The book includes many examples, illustrations, flowcharts, measurement results and screenshots of a worked-out automation software for microwave measurement. The book includes discussions on microwave measurements-attenuation, microwave power and E-field strength. The contents of this book will be of interest to students, researchers and scientists working in the field of electromagnetism, antennas, communication and electromagnetic interference/electromagnetic compatibility (EMI/EMC). .
541 _fUABC ;
_cTemporal ;
_d01/01/2021-12/31/2023.
650 0 _aMicrowaves.
650 0 _aOptical engineering.
650 0 _aPhysics.
650 0 _aElectrical engineering.
650 1 4 _aMicrowaves, RF and Optical Engineering.
_0https://scigraph.springernature.com/ontologies/product-market-codes/T24019
650 2 4 _aNumerical and Computational Physics, Simulation.
_0https://scigraph.springernature.com/ontologies/product-market-codes/P19021
650 2 4 _aCommunications Engineering, Networks.
_0https://scigraph.springernature.com/ontologies/product-market-codes/T24035
700 1 _aNarang, Naina.
_eauthor.
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
700 1 _aNegi, P. S.
_eauthor.
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
700 1 _aOjha, V. N.
_eauthor.
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
710 2 _aSpringerLink (Online service)
773 0 _tSpringer Nature eBook
776 0 8 _iPrinted edition:
_z9789811062797
776 0 8 _iPrinted edition:
_z9789811062810
830 0 _aSpringerBriefs in Computational Electromagnetics,
_x2365-6239
856 4 0 _zLibro electrónico
_uhttp://148.231.10.114:2048/login?url=https://doi.org/10.1007/978-981-10-6280-3
912 _aZDB-2-ENG
912 _aZDB-2-SXE
942 _cLIBRO_ELEC
999 _c244147
_d244146