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001 978-3-319-54422-9
003 DE-He213
005 20210201191532.0
007 cr nn 008mamaa
008 170829s2018 gw | s |||| 0|eng d
020 _a9783319544229
_9978-3-319-54422-9
050 4 _aTK7888.4
072 7 _aTJFC
_2bicssc
072 7 _aTEC008010
_2bisacsh
072 7 _aTJFC
_2thema
082 0 4 _a621.3815
_223
245 1 0 _aDependable Multicore Architectures at Nanoscale
_h[electronic resource] /
_cedited by Marco Ottavi, Dimitris Gizopoulos, Salvatore Pontarelli.
250 _a1st ed. 2018.
264 1 _aCham :
_bSpringer International Publishing :
_bImprint: Springer,
_c2018.
300 _aXXII, 281 p. 101 illus., 65 illus. in color.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
500 _aAcceso multiusuario
505 0 _aIntroduction -- Part I: Current Challenges -- Manufacturing Challenges -- Dependability Challenges -- An Application Scenario -- Part II: Solutions -- Manufacturability Solutions -- Dependability Solutions -- Application-Specific Solutions -- Part III: Roadmap -- Technological Road Map -- Architectural Roadmap.
520 _aThis book provides comprehensive coverage of the dependability challenges in today's advanced computing systems. It is an in-depth discussion of all the technological and design-level techniques that may be used to overcome these issues and analyzes various dependability-assessment methods. The impact of individual application scenarios on the definition of challenges and solutions is considered so that the designer can clearly assess the problems and adjust the solution based on the specifications in question. The book is composed of three sections, beginning with an introduction to current dependability challenges arising in complex computing systems implemented with nanoscale technologies, and of the effect of the application scenario. The second section details all the fault-tolerance techniques that are applicable in the manufacture of reliable advanced computing devices. Different levels, from technology-level fault avoidance to the use of error correcting codes and system-level checkpointing are introduced and explained as applicable to the different application scenario requirements. Finally the third section proposes a roadmap of future trends in and perspectives on the dependability and manufacturability of advanced computing systems from the special point of view of industrial stakeholders. Dependable Multicore Architectures at Nanoscale showcases the original ideas and concepts introduced into the field of nanoscale manufacturing and systems reliability over nearly four years of work within COST Action IC1103 MEDIAN, a think-tank with participants from 27 countries. Academic researchers and graduate students working in multi-core computer systems and their manufacture will find this book of interest as will industrial design and manufacturing engineers working in VLSI companies.
541 _fUABC ;
_cTemporal ;
_d01/01/2021-12/31/2023.
650 0 _aElectronic circuits.
650 0 _aComputer software-Reusability.
650 0 _aQuality control.
650 0 _aReliability.
650 0 _aIndustrial safety.
650 0 _aElectronics.
650 0 _aMicroelectronics.
650 0 _aMicroprocessors.
650 1 4 _aCircuits and Systems.
_0https://scigraph.springernature.com/ontologies/product-market-codes/T24068
650 2 4 _aPerformance and Reliability.
_0https://scigraph.springernature.com/ontologies/product-market-codes/I12077
650 2 4 _aQuality Control, Reliability, Safety and Risk.
_0https://scigraph.springernature.com/ontologies/product-market-codes/T22032
650 2 4 _aElectronics and Microelectronics, Instrumentation.
_0https://scigraph.springernature.com/ontologies/product-market-codes/T24027
650 2 4 _aProcessor Architectures.
_0https://scigraph.springernature.com/ontologies/product-market-codes/I13014
700 1 _aOttavi, Marco.
_eeditor.
_4edt
_4http://id.loc.gov/vocabulary/relators/edt
700 1 _aGizopoulos, Dimitris.
_eeditor.
_4edt
_4http://id.loc.gov/vocabulary/relators/edt
700 1 _aPontarelli, Salvatore.
_eeditor.
_4edt
_4http://id.loc.gov/vocabulary/relators/edt
710 2 _aSpringerLink (Online service)
773 0 _tSpringer Nature eBook
776 0 8 _iPrinted edition:
_z9783319544212
776 0 8 _iPrinted edition:
_z9783319544236
776 0 8 _iPrinted edition:
_z9783319853918
856 4 0 _zLibro electrónico
_uhttp://148.231.10.114:2048/login?url=https://doi.org/10.1007/978-3-319-54422-9
912 _aZDB-2-ENG
912 _aZDB-2-SXE
942 _cLIBRO_ELEC
999 _c244601
_d244600