| 000 | 00723cam a22002295i 4500 | ||
|---|---|---|---|
| 001 | 21770973 | ||
| 003 | MX-MeUAM | ||
| 005 | 20240425104933.0 | ||
| 008 | 171117s2018 xxu fr 000 0 eng d | ||
| 020 | _a9781493966769 | ||
| 020 | _a9781493966745 | ||
| 040 |
_aDLC _bspa _epn _cDLC _dMX-MeUAM |
||
| 050 | 4 |
_aQH212.S3 _bS23 2018 |
|
| 245 | 1 | 0 |
_aScanning electron microscopy and x-ray microanalysis / _cJoseph I. Goldstein ... [et al.] |
| 250 | _a4th ed. | ||
| 260 |
_aNew York, NY : _bSpringer, _c2018. |
||
| 300 |
_axxiii, 550 p. : _cil. ; _b29 cm. |
||
| 504 | _aIncluye referencias bibliográficas e índice. | ||
| 650 | 7 |
_aMicroscopia. _2lemb |
|
| 700 | 1 |
_aGoldstein, Joseph I. _eed. _933892 |
|
| 942 | _cLIBRO | ||
| 999 |
_c266733 _d266732 |
||