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020 _a9783031663918
_9978-3-031-66391-8
050 4 _aTK7867-7867.5
072 7 _aTJFC
_2bicssc
072 7 _aTEC008010
_2bisacsh
072 7 _aTJFC
_2thema
082 0 4 _a621.3815
_223
100 1 _aSyed, Wajih U.
_eauthor.
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
245 1 0 _aTapered Beams in MEMS
_h[electronic resource] :
_bA Symbolic Modeling Framework with Applications to Energy Harvesting /
_cby Wajih U. Syed, Ibrahim (Abe) M. Elfadel.
250 _a1st ed. 2024.
264 1 _aCham :
_bSpringer International Publishing :
_bImprint: Springer,
_c2024.
300 _aXXIII, 236 p. 108 illus.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
505 0 _aIntroduction -- Piezoelectric MEMS Energy Harvesting: Introduction to Reliability and Uncertainty Quantification -- Review of Euler-Bernoulli Rectangular Beam Theory -- Tapered-Beam Piezoelectric MEMS Energy Harvesters -- Modal Analysis of Tapered-Beam Piezoelectric MEMS Energy Harvesters -- Lumped-Parameter Modeling of Tapered-Beam Piezoelectric MEMS Energy Harvesters -- Symbolic Modeling Framework of Tapered-Beam Piezoelectric MEMS Energy Harvesters -- Uncertainty Quantification of Tapered-Beam Piezoelectric MEMS Energy Harvesters Using Monte Carlo Methods -- Uncertainty Quantification of Tapered-Beam Piezoelectric MEMS Energy Harvesters Using Polynomial Chaos Expansion -- Variation-Aware Design of Reliable Piezoelectric MEMS Energy Harvesters -- Other Applications of Tapered Beams in MEMS and Opto-MEMS.
520 _aThis book addresses important aspects of MEMS designs that are well established in engineering practice but rarely discussed in the standard textbooks. One such aspect is the ubiquitous use of tapered beams in the sensing and actuation elements of MEMS designs. As explained in this book, the tapered beam has distinct advantages over the standard rectangular beam but these advantages are often left unarticulated due to the blind trust in the finite-element models of MEMS devices. In this monograph, the authors take a fundamental, physics-based approach to the modeling of tapered beams in MEMS that is based on a rigorous perturbation analysis of the traditional Euler-Bernoulli beam. The authors demonstrate how perturbation methods combined with symbolic modeling and the tools of computer algebra enable the development of semi-analytical models for tapered-beam MEMS elements. They pay particular attention to the application of these novel models to piezoelectric MEMS energy harvesters with tapered-beam elements, including the development of lumped-parameter circuit models that can be readily used for fast electro-mechanical simulations. Another important aspect of MEMS designs that is extensively addressed in the book is the uncertainty quantification (UQ) of tapered-beam MEMS elements using both Monte Carlo and polynomial chaos expansion methods. These UQ methods are applied to the design of variation-aware piezoelectric energy harvesters. With consistent focus on MEMS devices with tapered beam elements, this up-to-date monograph Bridges the gap between the standard theories and engineering practice in the design of reliable MEMS devices. Combines perturbation methods with symbolic computer algebra to develop semi-analytical models of MEMS devices. Illustrates the use of symbolic models to facilitate the design of variation-aware piezoelectric MEMS energy harvesters.
541 _fUABC ;
_cPerpetuidad
650 0 _aElectronic circuits.
650 0 _aElectronics.
650 0 _aEnergy harvesting.
650 1 4 _aElectronic Circuits and Systems.
650 2 4 _aElectronics and Microelectronics, Instrumentation.
650 2 4 _aEnergy Harvesting.
700 1 _aElfadel, Ibrahim (Abe) M.
_eauthor.
_0(orcid)0000-0003-3220-9987
_1https://orcid.org/0000-0003-3220-9987
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
710 2 _aSpringerLink (Online service)
773 0 _tSpringer Nature eBook
776 0 8 _iPrinted edition:
_z9783031663901
776 0 8 _iPrinted edition:
_z9783031663925
776 0 8 _iPrinted edition:
_z9783031663932
856 4 0 _zLibro electrónico
_uhttp://libcon.rec.uabc.mx:2048/login?url=https://doi.org/10.1007/978-3-031-66391-8
912 _aZDB-2-ENG
912 _aZDB-2-SXE
942 _cLIBRO_ELEC
999 _c276679
_d276678