MARC details
| 000 -LÍDER |
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| fixed length control field |
03174cam a2200601Ki 4500 |
| 001 - NÚMERO DE CONTROL |
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| control field |
u379966 |
| 003 - IDENTIFICADOR DEL NÚMERO DE CONTROL |
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| control field |
SIRSI |
| 005 - FECHA Y HORA DE LA ULTIMA TRANSACCIÓN |
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| control field |
20160812084623.0 |
| 006 - ELEMENTOS DE LONGITUD FIJA - CARACTERÍSTICAS DE MATERIALES ADICIONALES - INFORMACIÓN GENERAL |
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| fixed length control field |
m o d |
| 007 - CAMPO FIJO DE DESCRIPCIÓN FIJA--INFORMACIÓN GENERAL |
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| fixed length control field |
cr cnu---unuuu |
| 008 - ELEMENTOS DE LONGITUD FIJA -- INFORMACIÓN GENERAL |
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| fixed length control field |
140529s2010 enka ob 001 0 eng d |
| 040 ## - FUENTE DE CATALOGACIÓN |
|---|
| Original cataloging agency |
OPELS |
| Language of cataloging |
eng |
| Description conventions |
rda |
| -- |
pn |
| Transcribing agency |
OPELS |
| 020 ## - NÚMERO INTERNACIONAL NORMALIZADO PARA LIBROS |
|---|
| International Standard Book Number |
9781455777532 (electronic bk.) |
| 020 ## - NÚMERO INTERNACIONAL NORMALIZADO PARA LIBROS |
|---|
| International Standard Book Number |
1455777536 (electronic bk.) |
| 020 ## - NÚMERO INTERNACIONAL NORMALIZADO PARA LIBROS |
|---|
| Canceled/invalid ISBN |
9780080964546 |
| 020 ## - NÚMERO INTERNACIONAL NORMALIZADO PARA LIBROS |
|---|
| Canceled/invalid ISBN |
0080964540 |
| 029 1# - OTHER SYSTEM CONTROL NUMBER (OCLC) |
|---|
| OCLC library identifier |
DEBSZ |
| System control number |
414275942 |
| 050 #4 - SIGNATURA TOPOGRÁFICA DE LA BIBLIOTECA DEL CONGRESO |
|---|
| Classification number |
T174.7 |
| Item number |
.L43 2010eb |
| 082 04 - NÚMERO DE CLASIFICACIÓN DECIMAL DEWEY |
|---|
| Classification number |
620.50287 |
| Edition number |
22 |
| 084 ## - OTHER CLASSIFICATION NUMBER |
|---|
| Classification number |
ZQ 3100 |
| Number source |
rvk |
| 049 ## - LOCAL HOLDINGS (OCLC) |
|---|
| Holding library |
TEFA |
| 100 1# - ASIENTO PRINCIPAL--NOMBRE PERSONAL |
|---|
| Personal name |
Leach, R. K. |
| 245 10 - MENCIÓN DE TITULO |
|---|
| Title |
Fundamental principles of engineering nanometrology |
| Medium |
[recurso electrónico] / |
| Statement of responsibility, etc. |
by Richard K. Leach. |
| 250 ## - MENCIÓN DE EDICIÓN |
|---|
| Edition statement |
First edition. |
| 264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE |
|---|
| Place of production, publication, distribution, manufacture |
Oxford : |
| Name of producer, publisher, distributor, manufacturer |
William Andrew ; |
| -- |
Elsevier Science, |
| Date of production, publication, distribution, manufacture, or copyright notice |
2010. |
| 300 ## - DESCRIPCIÓN FÍSICA |
|---|
| Extent |
1 online resource (xxvi, 321 pages) : |
| Other physical details |
illustrations. |
| 336 ## - CONTENT TYPE |
|---|
| Content type term |
text |
| Content type code |
txt |
| Source |
rdacontent |
| 337 ## - MEDIA TYPE |
|---|
| Media type term |
computer |
| Media type code |
c |
| Source |
rdamedia |
| 338 ## - CARRIER TYPE |
|---|
| Carrier type term |
online resource |
| Carrier type code |
cr |
| Source |
rdacarrier |
| 490 1# - MENCIÓN DE SERIE |
|---|
| Series statement |
Micro and nano technologies |
| 504 ## - NOTA DE BIBLIOGRAFÍA, ETC. |
|---|
| Bibliography, etc |
Includes bibliographical references and index. |
| 520 ## - NOTA DE RESUMEN, ETC. |
|---|
| Summary, etc. |
Working at the nano-scale demands an understanding of the high-precision measurement techniques that make nanotechnology and advanced manufacturing possible. This new edition of Fundamental Principles of Engineering Nanometrology provides a road map and toolkit for metrologists engaging with the rigor of measurement and data analysis at the nano-scale, from the fundamentals of precision measurement, to different measurement and characterization techniques. This book is an essential guide for the emerging nanomanufacturing and nanofabrication sectors, where measurement and standardization requirements are paramount both in product specification and quality assurance. Updated to cover new and emerging technologies, and recent developments in standards and regulatory frameworks, this second edition includes many new sections covering, for example, new technologies in scanning probe and e-beam microscopy (including DLS, NTA), recent developments in interferometry, and advances in co-ordinate metrology. |
| 588 ## - SOURCE OF DESCRIPTION NOTE |
|---|
| Source of description note |
Description based on print version record. |
| 596 ## - |
|---|
| -- |
19 |
| 650 #0 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
|---|
| Topical term or geographic name as entry element |
Nanotechnology. |
| 650 #0 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
|---|
| Topical term or geographic name as entry element |
Microtechnology. |
| 650 #0 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
|---|
| Topical term or geographic name as entry element |
Metrology. |
| 650 07 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
|---|
| Topical term or geographic name as entry element |
Metrologie. |
| Source of heading or term |
swd |
| 650 07 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
|---|
| Topical term or geographic name as entry element |
Nanostruktur. |
| Source of heading or term |
swd |
| 650 07 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
|---|
| Topical term or geographic name as entry element |
Nanotechnologie. |
| Source of heading or term |
swd |
| 650 #7 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
|---|
| Topical term or geographic name as entry element |
Metrology. |
| Source of heading or term |
fast |
| Authority record control number |
(OCoLC)fst01018841 |
| 650 #7 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
|---|
| Topical term or geographic name as entry element |
Microtechnology. |
| Source of heading or term |
fast |
| Authority record control number |
(OCoLC)fst01020132 |
| 650 #7 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
|---|
| Topical term or geographic name as entry element |
Nanotechnology. |
| Source of heading or term |
fast |
| Authority record control number |
(OCoLC)fst01032639 |
| 650 #7 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
|---|
| Topical term or geographic name as entry element |
Nanotechnologies. |
| Source of heading or term |
eclas |
| 650 #7 - ASIENTO SECUNDARIO DE MATERIA - TERMINO TEMÁTICO |
|---|
| Topical term or geographic name as entry element |
Métrologie. |
| Source of heading or term |
eclas |
| 655 #4 - |
|---|
| -- |
Electronic books. |
| 776 08 - ADDITIONAL PHYSICAL FORM ENTRY |
|---|
| Relationship information |
Print version: |
| Main entry heading |
Leach, R. K. |
| Title |
Fundamental principles of engineering nanometrology. |
| Edition |
First edition |
| International Standard Book Number |
9780080964546 |
| Record control number |
(OCoLC)435734573 |
| 830 #0 - ASIENTO SECUNDARIO DE SERIE--TITULO UNIFORME |
|---|
| Uniform title |
Micro & nano technologies. |
| 856 40 - LOCALIZACIÓN Y ACCESO ELECTRÓNICOS |
|---|
| Public note |
Libro electrónico |
| Materials specified |
ScienceDirect |
| Uniform Resource Identifier |
<a href="http://148.231.10.114:2048/login?url=http://www.sciencedirect.com/science/book/9781455777532">http://148.231.10.114:2048/login?url=http://www.sciencedirect.com/science/book/9781455777532</a> |
| 856 41 - LOCALIZACIÓN Y ACCESO ELECTRÓNICOS |
|---|
| Uniform Resource Identifier |
<a href="http://www.sciencedirect.com/science/book/9780080964546">http://www.sciencedirect.com/science/book/9780080964546</a> |
| 942 ## - TIPO DE MATERIAL (KOHA) |
|---|
| Koha item type |
Libro Electrónico |
