Fundamental principles of engineering nanometrology [recurso electrónico] / by Richard K. Leach.
Tipo de material:
TextoSeries Micro & nano technologiesEditor: Oxford : William Andrew ; Elsevier Science, 2010Edición: First editionDescripción: 1 online resource (xxvi, 321 pages) : illustrationsTipo de contenido: text Tipo de medio: computer Tipo de portador: online resourceISBN: 9781455777532 (electronic bk.); 1455777536 (electronic bk.)Tema(s): Nanotechnology | Microtechnology | Metrology | Metrologie | Nanostruktur | Nanotechnologie | Metrology | Microtechnology | Nanotechnology | Nanotechnologies | MétrologieGénero/Forma: Electronic books.Formatos físicos adicionales: Print version:: Fundamental principles of engineering nanometrology.Clasificación CDD: 620.50287 Clasificación LoC:T174.7 | .L43 2010ebOtra clasificación: ZQ 3100 Recursos en línea: Libro electrónico ScienceDirect
| Haga clic para acceso en línea Resumen: Working at the nano-scale demands an understanding of the high-precision measurement techniques that make nanotechnology and advanced manufacturing possible. This new edition of Fundamental Principles of Engineering Nanometrology provides a road map and toolkit for metrologists engaging with the rigor of measurement and data analysis at the nano-scale, from the fundamentals of precision measurement, to different measurement and characterization techniques. This book is an essential guide for the emerging nanomanufacturing and nanofabrication sectors, where measurement and standardization requirements are paramount both in product specification and quality assurance. Updated to cover new and emerging technologies, and recent developments in standards and regulatory frameworks, this second edition includes many new sections covering, for example, new technologies in scanning probe and e-beam microscopy (including DLS, NTA), recent developments in interferometry, and advances in co-ordinate metrology.
| Tipo de ítem | Biblioteca actual | Colección | Signatura | Copia número | Estado | Fecha de vencimiento | Código de barras |
|---|---|---|---|---|---|---|---|
| Libro Electrónico | Biblioteca Electrónica | Colección de Libros Electrónicos | T174.7 .L43 2010 EB (Browse shelf(Abre debajo)) | 1 | No para préstamo | 379966-2001 |
Includes bibliographical references and index.
Working at the nano-scale demands an understanding of the high-precision measurement techniques that make nanotechnology and advanced manufacturing possible. This new edition of Fundamental Principles of Engineering Nanometrology provides a road map and toolkit for metrologists engaging with the rigor of measurement and data analysis at the nano-scale, from the fundamentals of precision measurement, to different measurement and characterization techniques. This book is an essential guide for the emerging nanomanufacturing and nanofabrication sectors, where measurement and standardization requirements are paramount both in product specification and quality assurance. Updated to cover new and emerging technologies, and recent developments in standards and regulatory frameworks, this second edition includes many new sections covering, for example, new technologies in scanning probe and e-beam microscopy (including DLS, NTA), recent developments in interferometry, and advances in co-ordinate metrology.
Description based on print version record.
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