Scanning Transmission Electron Microscopy [recurso electrónico] : Imaging and Analysis / edited by Stephen J. Pennycook, Peter D. Nellist.
Tipo de material: TextoEditor: New York, NY : Springer New York : Imprint: Springer, 2011Descripción: XII, 762 p. online resourceTipo de contenido: text Tipo de medio: computer Tipo de portador: online resourceISBN: 9781441972002Tema(s): Microscopy | Optical materials | Nanotechnology | Surfaces (Physics) | Materials Science | Optical and Electronic Materials | Characterization and Evaluation of Materials | Biological Microscopy | Solid State Physics | Condensed Matter Physics | NanotechnologyFormatos físicos adicionales: Printed edition:: Sin títuloClasificación CDD: 620.11295 | 620.11297 Clasificación LoC:TA1750-1750.22Recursos en línea: Libro electrónicoTipo de ítem | Biblioteca actual | Colección | Signatura | Copia número | Estado | Fecha de vencimiento | Código de barras |
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Libro Electrónico | Biblioteca Electrónica | Colección de Libros Electrónicos | TA1750 -1750.22 (Browse shelf(Abre debajo)) | 1 | No para préstamo | 371854-2001 |
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TA174 .X566 2012 EB Service science, management, and engineering | TA175 .S384 2012 EB Manual of engineering drawing | TA1750 -1750.22 Device Physics of Narrow Gap Semiconductors | TA1750 -1750.22 Scanning Transmission Electron Microscopy | TA1750 -1750.22 Electronic Properties of Materials | TA1750 -1750.22 Fundamentals of Piezoelectric Sensorics | TA1750 -1750.22 Fundamentals of Semiconductors |
Electron Optics and Aberration Correction -- Fundamentals of Scattering Theory -- Image formation in STEM -- Electron energy loss spectroscopy -- Energy dispersive x-ray analysis -- STEM of complex oxides -- STEM of complex alloys -- STEM of catalysts -- STEM of semiconductor devices -- STEM of ceramic materials -- STEM of quasicrystals -- STEM of nanomaterials -- 3D STEM: tomography -- 3D STEM: depth slicing -- Nanobeam diffraction.
Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the editors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy: Imaging and Analysis provides a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the history of the field, the instrument, image formation and scattering theory, as well as practical aspects of imaging and analysis. The authors present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, and nanoscience. Therefore this is a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.
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