Lock-in Thermography [recurso electrónico] : Basics and Use for Evaluating Electronic Devices and Materials / by Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp.
Tipo de material: TextoSeries Springer Series in Advanced Microelectronics ; 10Editor: Berlin, Heidelberg : Springer Berlin Heidelberg, 2010Descripción: X, 258 p. online resourceTipo de contenido: text Tipo de medio: computer Tipo de portador: online resourceISBN: 9783642024177Tema(s): Physics | Engineering | Materials | Surfaces (Physics) | Physics | Optics, Optoelectronics, Plasmonics and Optical Devices | Characterization and Evaluation of Materials | Engineering, general | Structural MaterialsFormatos físicos adicionales: Printed edition:: Sin títuloClasificación CDD: 621.36 Clasificación LoC:QC350-467TA1501-1820QC392-449.5TA1750-1750.22Recursos en línea: Libro electrónicoTipo de ítem | Biblioteca actual | Colección | Signatura | Copia número | Estado | Fecha de vencimiento | Código de barras |
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Libro Electrónico | Biblioteca Electrónica | Colección de Libros Electrónicos | QC350 -467 (Browse shelf(Abre debajo)) | 1 | No para préstamo | 373440-2001 |
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QC350 -467 Lectures on Ultrafast Intense Laser Science 1 | QC350 -467 Integrated Silicon Optoelectronics | QC350 -467 Nonlinearities in Periodic Structures and Metamaterials | QC350 -467 Lock-in Thermography | QC350 -467 Single Molecule Spectroscopy in Chemistry, Physics and Biology | QC350 -467 Fiber Optics | QC350 -467 Progress in Ultrafast Intense Laser Science |
Introduction -- Physical and Technical Basics -- Timing Strategies -- Heat Dissipation Mechanisms in Solar Cells -- Carrier Density Imaging -- Illuminated Lock-in Thermography (ILIT) -- Experimental Technique -- Theory -- Measurement Strategies -- Typical Applications -- Summary and Outlook.
This book deals with lock-in thermography (LIT) as a special active dynamic variant of the well-known IR thermography. It enables a much improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. The book concentrates on applications to electronic devices and materials, but the basic chapters are useful as well for non-destructive evaluation. Various experimental approaches to LIT are reviewed with special emphasis to different available commercial LIT systems. New LIT applications are reviewed, like Illuminated LIT applied to solar cells , and non-thermal LIT lifetime mapping. Typical LIT investigation case studies are introduced.
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